| 摘要 |
The present invention relates to an insert for a test handler. According to the present invention, disclosed is a technique capable of fundamentally preventing problems caused by securing a thickness required to fix a support member on a contact surface by placing a fixed point of the support member in a thin film shape for preventing the separation of a semiconductor element inserted into an insertion hole downwards on the side of a body so as to completely omit the thickness required to fix the support member on the contact surface with which a terminal and a tester of the semiconductor element are electrically contacted. |
