发明名称 METHOD FOR FORMING PATTERNS OF DIFFERENTLY DOPED REGIONS
摘要 The disclosed technology generally relates to forming patterns of doped semiconductor regions, and more particularly to methods of forming such patterns in fabricating photovoltaic devices. In one aspect, a method of forming a pattern of different doped regions at the same side of a semiconductor substrate comprises providing a patterned doped layer on a surface of the semiconductor substrate at predetermined locations where at least one first doped region is to be formed. The method additionally includes selectively growing at least one second doped region epitaxially at the same side of the semiconductor substrate using the patterned doped layer as an epitaxial growth mask. Furthermore, selectively growing comprises driving dopants from the patterned doped layer into the semiconductor substrate to form the first doped region at the predetermined locations.
申请公布号 EP2740149(A1) 申请公布日期 2014.06.11
申请号 EP20120750718 申请日期 2012.08.01
申请人 IMEC 发明人 RECAMAN PAYO, MARIA;POSTHUMA, NIELS
分类号 H01L21/225;H01L21/02;H01L31/068;H01L31/18 主分类号 H01L21/225
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