| 摘要 |
The present invention relates to an inspection system and method for a display device. The inspection system is to provide the stain defect inspection standard of a display device under test and comprises a standard display device, which displays information on a standard stain image and on whether defects exist; a data management unit, which provides stain image data and data about whether defects exist for the standard display device; and a control unit, which controls the data management unit. The data management unit includes a data storage unit, which stores the stain image data and the data about whether defects exist; and a data generation unit, which generates the stain image data. According to the present invention, the standard display device provides a standard to inspect stain defects of the device under test, and more particularly, information on the standard stain image and whether defects exist. Therefore, according to the present invention, an operator can objectively inspects the stain defects of the display device under test based on the standard provided by the standard display device. |
