发明名称 FORMING SIC MOSFETS WITH HIGH CHANNEL MOBILITY BY TREATING THE OXIDE INTERFACE WITH CESIUM IONS
摘要 <p>Methods of forming a semiconductor structure include providing an insulation layer on a semiconductor layer and diffusing cesium ions into the insulation layer from a cesium ion source outside the insulation layer. A MOSFET including an insulation layer treated with cesium ions may exhibit increased inversion layer mobility.</p>
申请公布号 EP2740148(A1) 申请公布日期 2014.06.11
申请号 EP20120820668 申请日期 2012.06.22
申请人 CREE, INC.;AUBURN UNIVERSITY 发明人 DHAR, SARIT;RYU, SEI-HYUNG;AGARWAL, ANANT;WILLIAMS, JOHN ROBERT
分类号 H01L21/04;H01L29/78 主分类号 H01L21/04
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