发明名称 Tester having system maintenance compliance tool
摘要 A tester module for automatic test equipment (ATE) includes test instruments for testing an integrated circuit device under test (DUT). A plurality of sensors include sensors coupled to or proximate to the test instruments for detecting a plurality of different maintenance triggers associated with the test instruments. A memory stores code including operating system code for controlling the test instruments and for implementing a system maintenance compliance tool. A processor is coupled to the test instruments the sensors and the memory. The processor runs the operating system code including the system maintenance compliance tool. The system maintenance compliance tool upon receiving notification of at least a first maintenance trigger automatically blocks the ATE being used for the testing. The system maintenance compliance tool can include a listing of needed maintenance actions associated with the maintenance triggers that when completed automatically releases the ATE to allow resumption of testing.
申请公布号 US8751183(B2) 申请公布日期 2014.06.10
申请号 US201113245085 申请日期 2011.09.26
申请人 Texas Instruments Incorporated 发明人 Flores, Jr. Nicholas;Baker Richard G.;Burke, Jr. Dennis H.
分类号 G06F19/00;G01R31/3167 主分类号 G06F19/00
代理机构 代理人
主权项 1. Automatic test equipment (ATE) for testing integrated circuit (IC) devices, comprising: a load board attached to a test head for mounting at least one IC device under test (DUT) via a socket on said load board; a tester module including: test instruments operable for testing said DUT including communicating test signals to said DUT and receiving test data signals generated by said DUT responsive to said test signals through said test head via one or more electrical couplers;a plurality of sensors including sensors coupled to or proximate to said test instruments for detecting a plurality of different maintenance triggers associated with one or more of said test instruments;a memory that stores code including operating system code for controlling said test instruments and for implementing a system maintenance compliance tool, anda processor coupled to said test instruments, said plurality of sensors, and said memory, wherein said processor runs said operating system code including said system maintenance compliance tool;wherein said system maintenance compliance tool upon receiving notification of at least a first of said plurality of maintenance triggers automatically blocks said ATE being used for said testing.
地址 Dallas TX US