| 摘要 |
A device for optical measurement of materials includes a zone opposite a dot including a material, a light source emitting light along an axis in the direction of the zone, where the material interacts with the light it receives, and a light guide to convey a proportion of the light emitted by the dot under the effect of the illumination. The guide includes a light scatterer associated with the source and causing a proportion of the light emitted by the dot to penetrate into the guide, such that it is guided in a direction perpendicular to the axis; the scatterer is annular in shape, and thus delimits a zone of the light guide, and the area of the zone is greater than or equal to the area of the cross-section of the portion of light beam incident to the material. |
| 主权项 |
1. A device for optical measurement of a material, comprising:
a transparent support, including at least one zone, where said zone is configured to be positioned opposite a dot including a material, a light source associated with said zone, where the light source is designed to emit light along an axis (X), in the direction of the zone with which the light source is associated, where the material of the dot interacts with the light received from said light source, and a light guide to convey a proportion of the light emitted by the dot, under the effect of illumination by the light source, wherein the light guide includes a light scatterer associated with said light source, where said scatterer is configured to cause a proportion of the light emitted by the dot to penetrate into said light guide, such that the light is guided in a direction perpendicular to the axis of the light emitted by said light source, wherein the scatterer has an annular shape, and thus delimits a zone of the light guide, and wherein the area of the zone is greater than or equal to the area of the cross-section of the portion of the light beam incident to the material.
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