发明名称 |
Display device, method for manufacturing display device, and SOI substrate |
摘要 |
A manufacturing method is provided which achieves an SOI substrate with a large area and can improve productivity of manufacture of a display device using the SOI substrate. A plurality of single-crystalline semiconductor layers are bonded to a substrate having an insulating surface, and a circuit including a transistor is formed using the single-crystalline semiconductor layers, so that a display device is manufactured. Single-crystalline semiconductor layers separated from a single-crystalline semiconductor substrate are applied to the plurality of single-crystalline semiconductor layers. Each of the single-crystalline semiconductor layers has a size corresponding to one display panel (panel size). |
申请公布号 |
US8748243(B2) |
申请公布日期 |
2014.06.10 |
申请号 |
US201113249308 |
申请日期 |
2011.09.30 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei |
分类号 |
H01L21/786;H01L21/84 |
主分类号 |
H01L21/786 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a display device, comprising the steps of:
forming a plurality of projected portions each having an area including one panel in a first substrate by etching the first substrate; implanting an ion into the first substrate to form a plurality of single-crystalline semiconductor layers each having an area including one panel in the plurality of projected portions, respectively; bonding the plurality of single-crystalline semiconductor layers to a second substrate with an insulating layer interposed therebetween; exposing a first single-crystalline semiconductor layer and a second single-crystalline semiconductor layer each selected from the plurality of single-crystalline semiconductor layers at a time, wherein each of the first single-crystalline semiconductor layer and the second single-crystalline semiconductor layer has an area including one panel; and patterning the first single-crystalline semiconductor layer and the second singel-crystalline semiconductor layer to form a first display portion over the second substrate by using a patterned first single-crystalline semiconductor layer and a second display portion over the second substrate by using a patterned second single-crystalline semiconductor layer, wherein the insulating layer is a silicon oxide layer formed by a chemical vapor deposition method using an organic silane as a source gas.
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地址 |
Atsugi-shi, Kanagawa-ken JP |