| 摘要 |
The present invention relates to a method for detecting a defect on a substrate and, more particularly, to a method for detecting a defect on a substrate which is used as panel glass of a display device. The provided method for detecting a defect on a substrate comprises as follows: a pixel value obtaining step which obtains a pixel value of a substrate image by performing line scan on the substrate; a flattening step which flattens the obtained pixel value; and a detecting step which detects a defect on the substrate by comparing the flattened pixel value with a threshold. The flattening step is conducted by the following formula: Here, P(x, y) is a pixel value at coordinate (x, y), m(x) = a mode (h_x(k)), h(k) is a histogram of the entire obtained pixel values, h_x(k) is a histogram of the pixel value at coordinate x, and I is the maximum pixel value which can be obtained by a line-scan camera. |
