| 发明名称 |
X-ray characterization of solid small molecule organic materials |
| 摘要 |
The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data. |
| 申请公布号 |
US8751168(B2) |
申请公布日期 |
2014.06.10 |
| 申请号 |
US20100802064 |
申请日期 |
2010.05.28 |
| 申请人 |
The Trustees of Columbia University in the City of New York |
发明人 |
Billinge Simon;Shankland Kenneth;Shankland Norman;Florence Alastair |
| 分类号 |
G01N31/00 |
主分类号 |
G01N31/00 |
| 代理机构 |
|
代理人 |
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| 主权项 |
1. A method of reliably characterizing an amorphous material, the method comprising:
subjecting the amorphous material to x-ray beams having a wavelength less than or equal to 1.1 angstroms such that x-ray data is scattered from the amorphous material, collecting the scattered x-ray data over reciprocal lattice vector of at least 8.5 inverse angstroms, deriving an atomic pair distribution function (PDF) from the collected x-ray data, mathematically transforming the derived PDF data to a reduced total scattering structure function, and reliably determining structural information of the amorphous material.
|
| 地址 |
New York NY US |
