发明名称 |
Semiconductor device and method of fabricating the same |
摘要 |
A semiconductor device and method of fabricating the same, which forms a contact hole, a via hole or a via contact hole with multiple profiles with various taper angles. The semiconductor device includes a substrate, a thin film transistor formed on the substrate and having a semiconductor layer, a gate insulating layer, a gate electrode, and an interlayer dielectric, and a contact hole penetrating the gate insulating layer and the interlayer dielectric and exposing a portion of the semiconductor layer. The contact hole has a multiple profile in which an upper portion of the contact hole has a wet etch profile and a lower portion of the contact hole has at least one of the wet etch profile and a dry etch profile. |
申请公布号 |
US8749069(B2) |
申请公布日期 |
2014.06.10 |
申请号 |
US201113162836 |
申请日期 |
2011.06.17 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Kang Tae-Wook;Jeong Chang-Yong;Kim Chang-Soo;Seo Chang-Su;Park Moon-Hee |
分类号 |
H01L23/52 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a substrate; a metal interconnection line formed on the substrate; an interlayer dielectric formed on the metal interconnection line; and a via hole penetrating the interlayer dielectric and exposing a portion of the metal interconnection line, and having a triple profile in which an upper portion of the via hole has a wet etch profile, a middle portion of the via hole has a high selectivity dry etch profile, and a lower portion of the via hole has a high etch rate dry etch profile and a taper angle in a range of about 30° to about 70°.
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地址 |
Yongin KR |