发明名称 METHOD FOR MANUFACTURING REFLECTIVE MASK
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a reflective mask for forming a light-shielding frame on an outer circumference of a circuit pattern on a surface of a reflective mask to be used for semiconductor lithography, the surface where the circuit pattern is formed, by which the light-shielding frame having light-shielding property can be formed through an easy process without requiring etching or processing of an absorption layer and a multilayer reflection layer and without causing damages or changes in optical properties of the layers.SOLUTION: A light-shielding frame 10 to be formed in a reflective mask is formed by using photolithographic techniques using a photosensitive resin material on a surface of the mask where a circuit pattern is formed.
申请公布号 JP2014107479(A) 申请公布日期 2014.06.09
申请号 JP20120260934 申请日期 2012.11.29
申请人 TOPPAN PRINTING CO LTD 发明人 TAKAHASHI SATOSHI
分类号 H01L21/027;G03F1/24 主分类号 H01L21/027
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