发明名称 |
DEFECT DETERMINATION DEVICE, CORRESPONDENCE INFORMATION CREATION DEVICE, DEFECT DETERMINATION METHOD, AND CORRESPONDENCE INFORMATION CREATION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a defect determination device capable of accurately determining a defect.SOLUTION: A defect determination device (11) includes: an attention pixel selection part (111) for selecting one of a plurality of pixels as one attention pixel; a reference pixel group extraction part (112) for extracting a reference pixel group as a pixel group constituted of a plurality of pixels in a predetermined range around the attention pixel, that is, the pixel group excluding the attention pixel and pixels adjacent to the attention pixel on the basis of predetermined setting condition information; a defect candidate determination value deriving part (113) for calculating a mean luminance value in the reference pixel group, and for deriving a defect candidate determination value corresponding to the mean luminance value on the basis of predetermined correspondence information; a differential value calculation part (114) for calculating a differential value between the luminance value of the attention pixel and the mean luminance value; and a defect candidate determination part (115) for determining whether or not the attention pixel is a defect candidate pixel on the basis of the differential value and the defect candidate determination value. |
申请公布号 |
JP2014106198(A) |
申请公布日期 |
2014.06.09 |
申请号 |
JP20120261467 |
申请日期 |
2012.11.29 |
申请人 |
SHARP CORP |
发明人 |
YANASE MASAKAZU |
分类号 |
G01N21/958;G01B11/30;G01N21/892 |
主分类号 |
G01N21/958 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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