发明名称 DEFECT DETERMINATION DEVICE, CORRESPONDENCE INFORMATION CREATION DEVICE, DEFECT DETERMINATION METHOD, AND CORRESPONDENCE INFORMATION CREATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defect determination device capable of accurately determining a defect.SOLUTION: A defect determination device (11) includes: an attention pixel selection part (111) for selecting one of a plurality of pixels as one attention pixel; a reference pixel group extraction part (112) for extracting a reference pixel group as a pixel group constituted of a plurality of pixels in a predetermined range around the attention pixel, that is, the pixel group excluding the attention pixel and pixels adjacent to the attention pixel on the basis of predetermined setting condition information; a defect candidate determination value deriving part (113) for calculating a mean luminance value in the reference pixel group, and for deriving a defect candidate determination value corresponding to the mean luminance value on the basis of predetermined correspondence information; a differential value calculation part (114) for calculating a differential value between the luminance value of the attention pixel and the mean luminance value; and a defect candidate determination part (115) for determining whether or not the attention pixel is a defect candidate pixel on the basis of the differential value and the defect candidate determination value.
申请公布号 JP2014106198(A) 申请公布日期 2014.06.09
申请号 JP20120261467 申请日期 2012.11.29
申请人 SHARP CORP 发明人 YANASE MASAKAZU
分类号 G01N21/958;G01B11/30;G01N21/892 主分类号 G01N21/958
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