发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To increase a tolerance to surge voltage while keeping a low parasitic capacitance of a gate and maintaining high speed switching performance.SOLUTION: When an off driving signal turns a FET 5 off, a surge voltage occurs to bring a drain-source voltage VDS of the FET 5 to or above a protective voltage Vm1. Meanwhile, a detection voltage by a first voltage detection circuit 6A becomes higher than a threshold voltage Vth to turn a FET 13 off and a FET 14 on in a control circuit 9, which in turn turns a FET 11 off to bring a switch circuit 8 to a high impedance. A detection voltage by a second voltage detection circuit 6B later raises a gate voltage VGS of the FET 5 to or above a gate threshold voltage via a diode 15. The FET 5 then shoots through to release energy of the surge voltage to a source side.
申请公布号 JP2014107662(A) 申请公布日期 2014.06.09
申请号 JP20120258499 申请日期 2012.11.27
申请人 DENSO CORP 发明人 TAKASU HISASHI;KOBAYASHI ATSUSHI
分类号 H03K17/08;H02M1/00;H02M1/08;H03K17/695 主分类号 H03K17/08
代理机构 代理人
主权项
地址