发明名称 SYSTEM TEST SUPPORT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a system test support apparatus that determines the presence/absence of trouble in units of application processing on the basis of communication data from a system test object, and collects log information related to troubled locations alone.SOLUTION: Test data 104 in which communication data transmitted and received between a system test object 1 and a system test support apparatus 2 and a communication sequence defining its order of communication are stored in advance is formed in the system test support apparatus 2 in advance; the communication data is transmitted and received by a communication data transmitting/receiving function 100 between the apparatus and the system test object 1; the communication data and the test data are compared by a communication data collating function 101 to determine whether the state is normal or troubled; items of log information related to normal time and troubled time are extracted from the system test object 1 by a log information collecting function 102; and each is stored as normal time data 106 or troubled time data 105.
申请公布号 JP2014102717(A) 申请公布日期 2014.06.05
申请号 JP20120254855 申请日期 2012.11.21
申请人 MITSUBISHI ELECTRIC CORP 发明人 KABURAGI YASUYUKI
分类号 G06F11/22;G06F11/28;G06F11/30;G06F11/34 主分类号 G06F11/22
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