发明名称 X-RAY CAMERA
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce influence of current leaking from a reset transistor to a photoelectric conversion element, and provide a driving method of the semiconductor device.SOLUTION: A semiconductor device comprises a reset transistor, a photoelectric conversion element, a reset-side power source line and a diode-side power source line. In the semiconductor device, a gate terminal of the reset transistor is connected to a reset signal line, one terminal of the photoelectric conversion element is electrically connected with the diode-side power source line, and the other terminal is connected with the reset-side power source line via the reset transistor, and when the reset transistor is in a non-conductive state, potential of the reset-side power source line is brought closer to potential of the diode-side power source line.</p>
申请公布号 JP2014103675(A) 申请公布日期 2014.06.05
申请号 JP20130262345 申请日期 2013.12.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KIMURA HAJIME
分类号 H04N5/374;G01T7/00;H01L27/144;H01L27/146;H04N5/32;H04N5/357 主分类号 H04N5/374
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