METHOD AND SYSTEM FOR EMISSIVITY DETERMINATION

摘要

A surface of an object is irradiated using an infrared light beam. The infrared light beams reflected at the object are received by an infrared camera which captures a first intensity of the reflected infrared light beams on a detector of the infrared camera. Ambient radiation reflected at the object and the characteristic radiation of the object are detected by capturing a second intensity of the reflected ambient radiation and the characteristic radiation of the object on the detector of the infrared camera. The emissivity of the object is calculated based on the first intensity and the second intensity.