发明名称 METHOD OF EPITAXIAL GERMANIUM TIN ALLOY SURFACE PREPARATION
摘要 Methods of preparing a clean surface of germanium tin or silicon germanium tin layers for subsequent deposition are provided. An overlayer of Ge, doped Ge, another GeSn or SiGeSn layer, a doped GeSn or SiGeSn layer, an insulator, or a metal can be deposited on a prepared GeSn or SiGeSn layer by positioning a substrate with an exposed germanium tin or silicon germanium tin layer in a processing chamber, heating the processing chamber and flowing a halide gas into the processing chamber to etch the surface of the substrate using either thermal or plasma assisted etching followed by depositing an overlayer on the substantially oxide free and contaminant free surface. Methods can also include the placement and etching of a sacrificial layer, a thermal clean using rapid thermal annealing, or a process in a plasma of nitrogen trifluoride and ammonia gas.
申请公布号 US2014154875(A1) 申请公布日期 2014.06.05
申请号 US201414175527 申请日期 2014.02.07
申请人 Applied Materials, Inc. 发明人 SANCHEZ Errol Antonio C.;HUANG Yi-Chiau
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of preparing a surface, comprising: heating a substrate in a processing chamber to a first temperature, the substrate comprising a layer comprising Ge and Sn; removing contaminants from a surface of the layer comprising Ge and Sn; and depositing a second layer on the surface of the layer comprising Ge and Sn.
地址 Santa Clara CA US
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