| 发明名称 |
SECURE TESTING OF SEMICONDUCTOR DEVICE |
| 摘要 |
A method includes testing, by a processor, a secure portion of a semiconductor device through a first interface between the processor and the semiconductor device; and sending, by the processor, a pass or fail indication of a result of the testing of the secure portion of the semiconductor device to the tester through a second interface between the processor and the tester. |
| 申请公布号 |
US2014157001(A1) |
申请公布日期 |
2014.06.05 |
| 申请号 |
US201313846718 |
申请日期 |
2013.03.18 |
| 申请人 |
BROADCOM CORPORATION |
发明人 |
Buer Mark Leonard;Dzhendzhapanyan Norayr Norik |
| 分类号 |
G06F21/60 |
主分类号 |
G06F21/60 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus, comprising:
a first interface configured to communicate with a semiconductor device; a second interface configured to communicate with a tester; and a processor configured to test a secure portion of the semiconductor device, wherein the processor is configured to send a result of testing of the secure portion of the semiconductor device to the tester through the second interface.
|
| 地址 |
Irvine CA US |
