METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES

摘要

Method and apparatus are described for improving measurements of scattered light from particles by controlling multiple scattering and coincidence count levels. The scatter path in the particle dispersion and particle concentration are adjusted to reduce multiple scattering in ensemble particle scattering measurement. And the particle dispersion volume and particle concentration are adjusted to reduce coincidence counts in single particle scattering measurements. Alignment of the optical system, for measuring scattered light, is maintained by a reflection apparatus.

主权项

1. Apparatus for optimizing a path length of light in a particle dispersion to improve the measurement of light scattered from particles, comprising:
a) an optical system for illuminating a particle dispersion, b) a detection system comprising at least one detector for quantifying characteristics of light related to light scattered by at least one of said particles, c) a sample cell, comprising two optical windows, which confine said particle dispersion and pass light, from a light source, through said particle dispersion to illuminate at least one of said particles, d) means for adjusting a separation between said optical windows to change a path length of light in said sample cell, wherein said adjusting is performed by utilizing an electronic controlled actuator, and e) means for controlling said actuator based upon characteristics of light scattered from at least one of said particles.