发明名称 |
Optical Detection and Analysis of Particles |
摘要 |
The present invention provides a method of analysing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size. |
申请公布号 |
US2014152978(A1) |
申请公布日期 |
2014.06.05 |
申请号 |
US201214235988 |
申请日期 |
2012.08.06 |
申请人 |
Carr Robert Jeffrey Geddes;Hole John Patrick;Smith Jonathan Benjamin Kendall |
发明人 |
Carr Robert Jeffrey Geddes;Hole John Patrick;Smith Jonathan Benjamin Kendall |
分类号 |
G01N15/14 |
主分类号 |
G01N15/14 |
代理机构 |
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代理人 |
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主权项 |
1. A method of analysing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size.
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地址 |
Wiltshire GB |