发明名称 SOLUTION INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a solution inspection device capable of detecting output change of a terahertz oscillation element using terahertz wave (h&ngr;) by bringing a liquid or cell into contact with a resonance tunnel diode (RTD) oscillation element.SOLUTION: A solution inspection device 30 comprises: a terahertz oscillation element 38 for radiating terahertz wave I; a terahertz detection element 44 for receiving the terahertz wave I; and a solution 12 as an inspecting object disposed on the terahertz oscillation element. The solution inspection device 30 inspects the solution on the basis of the output characteristic of the terahertz wave varying in accordance with the relative dielectric constant of the solution 12.
申请公布号 JP2014102175(A) 申请公布日期 2014.06.05
申请号 JP20120254978 申请日期 2012.11.21
申请人 ROHM CO LTD;KYOTO UNIV 发明人 MUKAI TOSHIKAZU;OGAWA YUICHI
分类号 G01N21/35;H01Q1/38;H01Q13/02;H01Q23/00;H03B7/08 主分类号 G01N21/35
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