| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce leakage current, reduce the number of masks which require correction at the time of logic revision, and prevent automatic routing in a spare cell.SOLUTION: A P&R tool uses a standard cell 1 including a buffer, and a spare cell 2 of the standard cell 1. In the spare cell 2, sources of P-channel MOS transistors P1, P2 is disconnected from a line of power supply voltage VDD and connected to a line of ground voltage VSS. The standard cell 1 and the spare cell 2 are different only in a wiring pattern in a first metal wiring layer. Accordingly, leakage current in the unused pare cell 2 can be reduced. In addition, when a mask for the first wiring metal wiring layer is corrected, the spare cell 2 can be replaced with the standard cell 1. |
