| 摘要 |
<p>Apparatus for use in performing impedance measurements on a subject. The apparatus includes a processing system for causing a first signal to be applied to the subject, determining an indication of a second signal measured across the subject, using the indication of the second signal to determine any imbalance and if an imbalance exists, determining a modified first signal in accordance with the imbalance and causing the modified first signal to be applied to the subject to thereby allow at least one impedance measurement to be performed.</p> |
