发明名称
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing easily and at low cost an Si<SB>3</SB>N<SB>4</SB>heteroepitaxial buffer layer having a uniform thickness over a whole surface of a silicon substrate, and being stable in quality. SOLUTION: The silicon substrate is cleaning-processed so as to be capable of being surface reconstructed, then on the cleaning-processed silicon substrate, a dissociated nitrogen atom flux and an excited nitrogen molecule flux generated by RF (high frequency) high brightness (HB) discharge of an inductively coupled plasma system are irradiated to epitaxially grow an Si<SB>3</SB>N<SB>4</SB>single crystal film by a surface interfacial reaction. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5513763(B2) 申请公布日期 2014.06.04
申请号 JP20090079602 申请日期 2009.03.27
申请人 发明人
分类号 H01L21/203;H01L21/205;H01L21/31 主分类号 H01L21/203
代理机构 代理人
主权项
地址