| 摘要 |
<p>The present invention provides an optical test device capable of equalizing measuring conditions of quantity of light regardless of the probe position corresponding to each chip, so as to equalize measured values of the quantity of light, wherein, served as an optical correcting unit which measures the quantity of light through a plurality of simultaneous probe contacts in optical property measurement of a chip (22) (such as an LED chip) of a lighting device, the optical test device has: contact probes (21) used for a power supply; and virtual probes which are arranged at two sides of the contact probe group, aim at blocking diffused lights outside the device, and are used for obtaining the equal measuring condition.</p> |
