发明名称 Method of performing tomographic imaging of a sample in a charged-particle microscope
摘要 <p>A method of performing tomographic imaging of a sample in a charged-particle microscope, comprising the following steps: - Providing a beam of charged particles that propagate along a particle-optical axis; - Providing the sample on a sample holder that can be tilted relative to said beam; - In an imaging step, directing the beam through the sample so as to form and capture an image of the sample at an image detector; - Repeating this procedure at each of a series of sample tilts so as to acquire a corresponding set of images; - Mathematically processing images from said set so as to construct a composite image of the sample, whereby, in said imaging step, a sequence of component images is captured at a corresponding sequence of focus settings. This renders a 3D imaging cube rather than a 2D imaging sheet at a given sample tilt.</p>
申请公布号 EP2738786(A1) 申请公布日期 2014.06.04
申请号 EP20120194825 申请日期 2012.11.29
申请人 FEI COMPANY 发明人 SCHOENMAKERS, REMCO;LUECKEN, UWE;FRANKEN, ERIK
分类号 H01J37/26;H01J37/21;H01J37/22 主分类号 H01J37/26
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