发明名称 |
Method of performing tomographic imaging of a sample in a charged-particle microscope |
摘要 |
<p>A method of performing tomographic imaging of a sample in a charged-particle microscope, comprising the following steps:
- Providing a beam of charged particles that propagate along a particle-optical axis;
- Providing the sample on a sample holder that can be tilted relative to said beam;
- In an imaging step, directing the beam through the sample so as to form and capture an image of the sample at an image detector;
- Repeating this procedure at each of a series of sample tilts so as to acquire a corresponding set of images;
- Mathematically processing images from said set so as to construct a composite image of the sample,
whereby, in said imaging step, a sequence of component images is captured at a corresponding sequence of focus settings. This renders a 3D imaging cube rather than a 2D imaging sheet at a given sample tilt.</p> |
申请公布号 |
EP2738786(A1) |
申请公布日期 |
2014.06.04 |
申请号 |
EP20120194825 |
申请日期 |
2012.11.29 |
申请人 |
FEI COMPANY |
发明人 |
SCHOENMAKERS, REMCO;LUECKEN, UWE;FRANKEN, ERIK |
分类号 |
H01J37/26;H01J37/21;H01J37/22 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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