发明名称 HIGH RESOLUTION TIME INTERVAL MEASUREMENT APPARATUS AND METHOD
摘要 A time interval measurement apparatus and method counts the total number of full clock time periods between two measurement signals. Clock fractional time periods are generated between each of the two measurement signals and the next leading edge of a full clock time period. The total number of full clock time periods and the clock fractional time periods are converted to a time equivalent measurement and combined to generate the total time interval between the two measurement signals.
申请公布号 CA2550464(C) 申请公布日期 2014.06.03
申请号 CA20062550464 申请日期 2006.06.20
申请人 AMETEK, INC. 发明人 PATTEE, JACK;ZHUKOV, MIKHAIL S.
分类号 G04F10/00 主分类号 G04F10/00
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