Integrated circuit with an adaptable contact pad reconfiguring architecture

摘要

An apparatus and method are disclosed for providing test mode contact pad reconfigurations that expose individual internal functional modules or block groups in an integrated circuit for testing and for monitoring. A plurality of switches between each functional module switches between passing internal signals among the blocks and passing in/out signals external to the block when one or more contact pads are strapped to input a pre-determined value. Another set of switches between the functional modules and input/output contact pads switch between functional inputs to and from the functional modules and monitored signals or input/output test signals according to the selected mode of operation.

主权项

1. An integrated circuit, comprising:
a switching interconnect module; a controller module, coupled to the switching interconnect module, configured to cause the switching interconnect module to enter into a testing mode of operation or a monitoring mode of operation; and a plurality of functional modules, coupled to the switching interconnect module, each of the plurality of functional modules being configured to communicate with the switching interconnect module over a corresponding signal pathway from among a plurality of signal pathways, wherein the switching interconnect module is configurable to couple a signal pathway from among the plurality of signal pathways to another signal pathway from among the plurality of signal pathways.