发明名称 Non volatile semiconductor memory device and manufacturing method thereof
摘要 In accordance with an embodiment, a non volatile semiconductor memory device includes a substrate, a first electrode, a functional film, and a second electrode. The first electrode is provided on the substrate. The functional film is located on the first electrode and serves as a storage medium. The second electrode is provided on the functional film or in the functional film, and has a convex curved upper surface.
申请公布号 US8743601(B2) 申请公布日期 2014.06.03
申请号 US201213408336 申请日期 2012.02.29
申请人 Kabushiki Kaisha Toshiba 发明人 Suguro Kyoichi
分类号 G11C11/14;G11C11/16 主分类号 G11C11/14
代理机构 代理人
主权项 1. A non volatile semiconductor memory device comprising: a substrate; a first electrode on the substrate; a functional film as a storage medium on the first electrode; and a second electrode on or in the functional film, the second electrode having a convex curved upper surface; wherein the functional film and the second electrode are made of a combination of a metal having low resistance to oxidization and a metal having high resistance to oxidization.
地址 Tokyo JP