发明名称 |
Field effect transistor with gated and non-gated trenches |
摘要 |
A field effect transistor includes a plurality of trenches extending into a semiconductor region of a first conductivity type. The plurality of trenches includes a plurality of gated trenches and a plurality of non-gated trenches. A body region of a second conductivity extends in the semiconductor region between adjacent trenches. A dielectric material fills a bottom portion of each of the gated and non-gated trenches. A gate electrode is disposed in each gated trench. A conductive material of the second conductivity type is disposed in each non-gated trench such that the conductive material and contacts corresponding body regions along sidewalls of the non-gated trench. |
申请公布号 |
US8742401(B2) |
申请公布日期 |
2014.06.03 |
申请号 |
US201314068781 |
申请日期 |
2013.10.31 |
申请人 |
Fairchild Semiconductor Corporation |
发明人 |
Yilmaz Hamza;Calafut Daniel;Sapp Steven;Kraft Nathan;Challa Ashok |
分类号 |
H01L29/76 |
主分类号 |
H01L29/76 |
代理机构 |
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代理人 |
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主权项 |
1. A field effect transistor (FET), comprising:
a gated trench disposed in a semiconductor region of a first conductivity type; a non-gated trench disposed in the semiconductor region; a body region of a second conductivity type disposed in the semiconductor region and adjacent the non-gated trench; a first shield electrode disposed in a bottom portion of the gated trench; a second shield electrode disposed in a bottom portion of the non-gated trench; a dielectric layer disposed in the non-gated trench; and a conductive material of the second conductivity type disposed in the non-gated trench such that the dielectric layer is disposed between the second shield electrode disposed in the non-gated trench and the conductive material, the conductive material contacting the body region adjacent the non-gated trench and contacting a sidewall of the non-gated trench.
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地址 |
South Portland ME US |