发明名称 Sensor and inspection system deploying an optical conduit
摘要 Embodiments of an inspection system comprise a conduit that can transmit light between a sensor and a processing component. In one embodiment, the sensor comprises an element that generates an electromagnetic field in response to an input from the processing component. The input comprises a light signal that traverses the conduit to the sensor. The sensor converts the light signal to an electrical signal to operate the element. In one example, the sensor generates a plurality of light signals, which also traverse the conduit to the diagnostic component where the lights signals are processed to determine, in one example, proximity of an object to the sensor.
申请公布号 US8742319(B2) 申请公布日期 2014.06.03
申请号 US201113324795 申请日期 2011.12.13
申请人 General Electric Company 发明人 Sheikman Boris Leonid;Weller Nathan Andrew
分类号 G01J1/04 主分类号 G01J1/04
代理机构 代理人
主权项 1. A sensor assembly, comprising: a sensor; an optical data conduit coupled to the sensor; and a sensor signal processing and control component coupled to the optical data conduit, wherein the sensor and the sensor signal processing and control component are configured to exchange light signals via the optical data conduit, wherein the sensor comprises a photo-detector that is configured to generate a first electrical driving signal, a directional coupler that is configured to direct the electrical driving signal to an element that is configured to generate an electromagnetic field in response to the electrical driving signal and to a light source, wherein the light source is configured to generate a reverse reflected optical signal in response to reflection of the electrical driving signal in the element and a forward reflected signal with properties based on properties of the electrical driving signal, and wherein the sensor signal processing and control component comprises a photo-detector that is configured to convert the reverse reflected optical signal to a reverse reflected processing signal that identifies the proximity of an object to the sensor.
地址 Schenectady NY US