发明名称 |
Thin film transistor using an oxide semiconductor and display |
摘要 |
A thin film transistor includes a gate electrode, a gate insulation layer, a channel layer, a source electrode, and a drain electrode formed on a substrate, in which: the channel layer contains indium, germanium, and oxygen; and the channel layer has a compositional ratio expressed by In/(In+Ge) of 0.5 or more and 0.97 or less. |
申请公布号 |
US8742412(B2) |
申请公布日期 |
2014.06.03 |
申请号 |
US20090809096 |
申请日期 |
2009.01.30 |
申请人 |
Canon Kabushiki Kaisha |
发明人 |
Goyal Amita;Itagaki Naho;Iwasaki Tatsuya |
分类号 |
H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A thin film transistor comprising:
a substrate; a gate electrode; a gate insulation layer; a channel layer; a source electrode; and a drain electrode, said gate electrode, gate insulation layer, channel layer, source electrode and drain electrode being formed on said substrate, wherein said channel layer is amorphous, and the elements present in greatest amounts in said channel layer are indium, germanium, and oxygen; wherein said channel layer has a compositional ratio expressed by In/(In+Ge) of 0.5-0.75, and wherein said thin film transistor has an S value that is less than 0.55V/dec.
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地址 |
Tokyo JP |