Detection and identification of surfaces and surface contaminants

摘要

Aspects of the subject technology relate to methods and systems for identifying a target material. The system includes a tunable laser, an imaging device, and a signal processor. The tunable laser is configured to intermittently direct electromagnetic radiation of at least one selected wavelength at a surface of a target material. The imaging device is configured to capture at least one “on” image of the surface when the electromagnetic radiation of the at least one selected wavelength is directed at the surface and capture at least one “off” image of the surface when electromagnetic radiation of the at least one selected wavelength is not directed at the surface. The signal processor is configured to compare, for each selected wavelength, the “on” image(s) corresponding to the selected wavelength with the “off” image(s) corresponding to the selected wavelength and identify the target material based on the comparison.

主权项

1. A system for identifying a target material, the system comprising:
a tunable laser configured to intermittently direct electromagnetic radiation of at least one selected wavelength at a surface of a target material; an imaging device configured to:
capture at least one “on” image of the surface when the electromagnetic radiation of the at least one selected wavelength is directed at the surface, andcapture at least one “off” image of the surface when electromagnetic radiation of the at least one selected wavelength is not directed at the surface; and a signal processor configured to:
compare, for each selected wavelength, the at least one “on” image corresponding to the selected wavelength with the at least one “off” image corresponding to the selected wavelength, andidentify the target material based on the comparison.