Parameter tracking for memory devices

摘要

Methods and systems involve collecting memory device parameters and using memory device parameters to determine memory wear information. A set of first parameters associated with wear of the memory device is monitored for at least one memory unit of the memory device. The first parameters are compared to respective trigger criterion. If the comparison reveals that one or more of the first parameters are beyond their trigger criterion, then collection of a second set of parameters is triggered. The second parameters are also indicative of the wear of the memory device. The set of first parameters may overlap the set of second parameters. The set of second parameters are used to develop memory wear information. In some implementations, the memory wear information may be configuration information used to configure the read/write channel to compensate for wear of the memory device. In some implementations, the memory wear information may be used to predict or estimate the lifetime of the device.

主权项

1. A method of operating a controller for a charge storage memory device, wherein the memory device comprises blocks of memory units, the method comprising:
monitoring a set of first parameters of at least one of the memory units of the memory device, the set of first parameters associated with wear of the memory device and the monitoring including measuring the first parameters at each of multiple first intervals that occur over a time period that the memory device is in operation and that are timed according to block-level memory device operations; comparing the first parameters to respective trigger criterion; in response to the comparing, triggering collection of a set of second parameters associated with wear of the memory device; developing memory wear information using the second parameters: and storing at least one of the first parameters and the second parameters for each block of memory units in a storage area within the block of memory units.