发明名称 |
Method for fabricating a through wire interconnect (TWI) on a semiconductor substrate having a bonded connection and an encapsulating polymer layer |
摘要 |
A method for fabricating a through wire interconnect for a semiconductor substrate having a substrate contact includes the steps of: forming a via through the semiconductor substrate from a first side to a second side thereof; placing a wire in the via having a first end with a bonded connection to the substrate contact and a second end proximate to the second side; forming a first contact on the wire proximate to the first side; forming a second contact on the second end of the wire; and forming a polymer layer on the first side at least partially encapsulating the wire while leaving the first contact exposed. |
申请公布号 |
US8741667(B2) |
申请公布日期 |
2014.06.03 |
申请号 |
US201314050535 |
申请日期 |
2013.10.10 |
申请人 |
Micron Technology, Inc. |
发明人 |
Hembree David R;Wood Alan G. |
分类号 |
H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a through wire interconnect for a semiconductor substrate having a first side, a second side, a substrate contact on the first side, and an integrated circuit in electrical communication with the substrate contact comprising:
forming a via through the semiconductor substrate from the first side to the second side; placing a wire in the via having a first end with a bonded connection to the substrate contact and a second end proximate to the second side; forming a first contact on the wire proximate to the first side and a second contact on the wire proximate to the second side; and forming a polymer layer on the first side at least partially encapsulating the wire while leaving the first contact exposed.
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地址 |
Boise ID US |