发明名称 PATTERN FORMING METHOD
摘要 A patterning method is provided to reduce line edge roughness, and to improve dimensional stability of a pattern. A patterning method includes the steps of: (a) coating a substrate with a resist composition containing a resin which contains repeating units represented by the following formula(NGH-1), increases in polarity under an action of an acid, and decreases in solubility in a negative type developer; (b) performing exposure; and (c) performing developing using a negative type developer. In the formula, R_NGH1 represents a hydrogen atom or alkyl group, and each of R_NGH2 to R_NGH4 represents a hydrogen atom or hydroxyl group, with the proviso that at least one of R_NGH2 to R_NGH4 represents a hydroxyl group.
申请公布号 KR101401514(B1) 申请公布日期 2014.06.03
申请号 KR20080033950 申请日期 2008.04.11
申请人 发明人
分类号 G03F7/004 主分类号 G03F7/004
代理机构 代理人
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