| 发明名称 |
Method and circuit for testing a multi-chip package |
| 摘要 |
A method and circuit for testing a multi-chip package is provided. The multi-chip package includes at least a memory chip, and the memory chip includes a number of memory cells. The method includes performing a normal read operation on the memory cells to check if data read from the memory cells is the same with preset data in the memory cells; and performing a special read operation on the memory cells to check if data read from the memory cells is the same with an expected value, wherein the expected value is independent from data stored in the memory cells. |
| 申请公布号 |
US8743638(B2) |
申请公布日期 |
2014.06.03 |
| 申请号 |
US201213564189 |
申请日期 |
2012.08.01 |
| 申请人 |
Macronix International Co., Ltd. |
发明人 |
Hung Chun-Hsiung;Ho Wen-Chiao;Chang Kuen-Long |
| 分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for operating a memory chip, the memory chip comprising a plurality of memory cells, the method comprising:
performing a special read operation on the memory cells, comprising: applying a word-line voltage to a plurality of word lines of the memory cells and using a reference current; wherein the word-line voltage or the reference current is higher or lower than that in a normal read operation on the memory cells such that an expected value independent from values of data stored in the memory cells is obtained for the memory cells without defects.
|
| 地址 |
Hsinchu TW |
