发明名称 Micromachined inertial sensor devices
摘要 A micromachined inertial sensor with a single proof-mass for measuring 6-degree-of-motions. The single proof-mass includes a frame, an x-axis proof mass section attached to the frame by a first flexure, and a y-axis proof mass section attached to the frame by a second flexure. The single proof-mass is formed in a micromachined structural layer and is adapted to measure angular rates about three axes with a single drive motion and linear accelerations about the three axes.
申请公布号 US8739626(B2) 申请公布日期 2014.06.03
申请号 US20100849742 申请日期 2010.08.03
申请人 Fairchild Semiconductor Corporation 发明人 Acar Cenk
分类号 G01C19/56 主分类号 G01C19/56
代理机构 代理人
主权项 1. A sensor for measuring a motion thereof, comprising: a frame; a first planar proof mass section attached to the frame by a first flexure; a second planar proof mass section attached to the frame by a second flexure; and an anchor secured to a wafer disposed beneath the first planar proof mass section and the second planar proof mass section, wherein the frame, the first planar proof mass section, and the second planar proof mass section are formed in a micromachined layer and are adapted to measure angular rates about three axes and linear accelerations about the three axes, and wherein the first planar proof mass section and the second planar proof mass section are configured to be driven, in phase, about the anchor.
地址 San Jose CA US