发明名称 |
CAPACITOR USING MIDDLE OF LINE (MOL) CONDUCTIVE LAYERS |
摘要 |
<p>A method for fabricating a metal-insulator-metal (MIM) capacito includes depositing a first middle of line (MOL) conductive layer over a shallow trench isolation (STI) region of a semiconductor substrate. The first MOL conductive layer provides a first plate (330) of the MIM capacitor as well as a first set of local interconnects (120-1...4) to source and drain regions (104, 106) of a semiconductor device. The method also includes depositing an insulator layer (340) on the first MOL conductive layer as a dielectric layer of the MIM capacitor. The method further includes depositing a second MOL conductive layer (350) on the insulator layer as a second plate of the MIM capacitor.</p> |
申请公布号 |
WO2014081982(A1) |
申请公布日期 |
2014.05.30 |
申请号 |
WO2013US71347 |
申请日期 |
2013.11.21 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
CHIDAMBARAM, PR;YANG, BIN |
分类号 |
H01L49/02;H01L23/522;H01L27/06 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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