发明名称 CAPACITOR USING MIDDLE OF LINE (MOL) CONDUCTIVE LAYERS
摘要 <p>A method for fabricating a metal-insulator-metal (MIM) capacito includes depositing a first middle of line (MOL) conductive layer over a shallow trench isolation (STI) region of a semiconductor substrate. The first MOL conductive layer provides a first plate (330) of the MIM capacitor as well as a first set of local interconnects (120-1...4) to source and drain regions (104, 106) of a semiconductor device. The method also includes depositing an insulator layer (340) on the first MOL conductive layer as a dielectric layer of the MIM capacitor. The method further includes depositing a second MOL conductive layer (350) on the insulator layer as a second plate of the MIM capacitor.</p>
申请公布号 WO2014081982(A1) 申请公布日期 2014.05.30
申请号 WO2013US71347 申请日期 2013.11.21
申请人 QUALCOMM INCORPORATED 发明人 CHIDAMBARAM, PR;YANG, BIN
分类号 H01L49/02;H01L23/522;H01L27/06 主分类号 H01L49/02
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