发明名称 POLISHING SYSTEM WITH IN-SEQUENCE SENSOR
摘要 <p>A polishing apparatus includes a plurality of stations supported on a platform, the plurality of stations including at least two polishing stations and a transfer station, each polishing station including a platen to support a polishing pad, a plurality of carrier heads suspended from and movable along a track such that each polishing station is selectively positionable at the stations, and a controller configured to control motion of the carrier heads along the track such that during polishing at each polishing station only a single carrier head is positioned in the polishing station.</p>
申请公布号 WO2014081590(A1) 申请公布日期 2014.05.30
申请号 WO2013US69730 申请日期 2013.11.12
申请人 APPLIED MATERIALS, INC. 发明人 DAVID, JEFFREY DRUE;SWEDEK, BOGUSLAW A.;BENNETT, DOYLE E.;OSTERHELD, THOMAS H.;CHERIAN, BENJAMIN;BENVEGNU, DOMINIC J.;LEE, HARRY Q.;D'AMBRA, ALLEN L.;RANGARAJAN, JAGAN
分类号 H01L21/304 主分类号 H01L21/304
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