发明名称 |
METHOD FOR MANUFACTURING NITRIDE BASED SEMICONDUCTOR DEVICE EMPLOYING RF-SPUTTERING |
摘要 |
Disclosed is a method of manufacturing nitride based semiconductor. A manufacturing method according to the present invention includes: a step of preparing a substrate; a step of forming a buffer layer to prevent a dislocation with the substrate on the substrate; a step of forming a spacer on the buffer layer; a step of forming a barrier layer to form a heterojunction structure with the spacer on the spacer; a step of forming a protective layer on the barrier layer; and a step of forming an HfO2 layer on the protective layer by RF sputtering. |
申请公布号 |
KR20140065829(A) |
申请公布日期 |
2014.05.30 |
申请号 |
KR20120132765 |
申请日期 |
2012.11.22 |
申请人 |
SNU R&DB FOUNDATION |
发明人 |
SEOK, O GYUN;AHN, WOO JIN;HAN, MIN KOO |
分类号 |
H01L21/335;H01L21/203;H01L29/778 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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