发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF PROCESSING SUBSTRATE, AND SUBSTRATE PROCESSING APPARATUS
摘要 <p>An insulating film having features such as a low dielectric constant, a low etching rate and a high insulating property is formed. An oxycarbonitride film is formed on a substrate by performing a cycle a predetermined number of times, the cycle including: (a) supplying a gas containing an element to the substrate; (b) supplying a carbon-containing gas to the substrate; (c) supplying a nitrogen-containing gas to the substrate; and (d) supplying an oxygen-containing gas to the substrate.</p>
申请公布号 KR101400690(B1) 申请公布日期 2014.05.29
申请号 KR20130112551 申请日期 2013.09.23
申请人 发明人
分类号 H01L21/205;H01L21/31 主分类号 H01L21/205
代理机构 代理人
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