发明名称 |
RESISTIVE MEMORY DEVICE HAVING SELECTED SENSING OPERATION AND THEREFORE ACCESS CONTROL METHOD |
摘要 |
A resistive memory device having a selective sensing operation and an access operation control method thereof are disclosed. For the method for controlling a read operation of the resistive memory device according to the present invention, start timing of a bit line sensing operation starts after a read command is applied. When at least one word line among a plurality of word lines is activated in response to an active command, data stored in a memory cell corresponding to a selected page among all memory cells connected to the activated word line is sensed through a bit line sense amplifier after receiving the read command. According to the present invention, a chip size of the resistive memory device is reduced as a number of installed bit line sense amplifiers reduces while supporting a page open policy. In addition, power consumption and noise are also reduced during the memory operation since the selective sensing operation is implemented for a selected memory cell. |
申请公布号 |
KR20140065319(A) |
申请公布日期 |
2014.05.29 |
申请号 |
KR20130015891 |
申请日期 |
2013.02.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, DONG SEOK;KIM, CHAN KYUNG;LEE, YUN SANG;CHA, SOO HO |
分类号 |
G11C13/00;G11C16/26 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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