发明名称 NANOCRYSTAL FORMATION USING ATOMIC LAYER DEPOSITION
摘要 Nanocrystal structures formed using atomic layer deposition (ALD) processes are useful in the formation of integrated circuits such as memory devices. Rather than continuing the ALD process until a continuous layer is formed, the ALD process is halted prematurely to leave a discontinuous formation of nanocrystals which are then capped by a different material, thus forming a layer with a discontinuous portion and a bulk portion. Such nanocrystals can serve as charge-storage sites within the bulk portion, and the resulting structure can serve as a floating gate of a floating-gate memory cell. A floating gate may contain one or more layers of such nanocrystal structures.
申请公布号 US2014148002(A1) 申请公布日期 2014.05.29
申请号 US201414171010 申请日期 2014.02.03
申请人 MICRON TECHNOLOGY, INC. 发明人 MAJHI PRASHANT;MIN KYU S.;TSAI WILMAN
分类号 H01L21/28;H01L21/02 主分类号 H01L21/28
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