发明名称 |
MATCHING SEMICONDUCTOR CIRCUITS |
摘要 |
Devices, circuitry, and methods for improving matching between semiconductor circuits are shown and described. Measuring a difference in matching between semiconductor circuits may be performed with a test current generator and test current measurement circuit, and adjusting a threshold voltage of a semiconductor component of at least one circuit until the difference between the circuits is at a desired difference may be performed with a program circuit. |
申请公布号 |
US2014146616(A1) |
申请公布日期 |
2014.05.29 |
申请号 |
US201213687706 |
申请日期 |
2012.11.28 |
申请人 |
MARMIROLI ANDREA;VIMERCATI DANIELE;MICRON TECHNOLOGY, INC. |
发明人 |
MARMIROLI ANDREA;VIMERCATI DANIELE |
分类号 |
G11C16/10 |
主分类号 |
G11C16/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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