发明名称 Free Layer with Out-of-Plane Anisotropy for Magnetic Device Applications
摘要 Synthetic antiferromagnetic (SAF) and synthetic ferrimagnetic (SyF) free layer structures are disclosed that reduce Ho (for a SAF free layer), increase perpendicular magnetic anisotropy (PMA), and provide higher thermal stability up to at least 400° C. The SAF and SyF structures have a FL1/DL1/spacer/DL2/FL2 configuration wherein FL1 and FL2 are free layers with PMA, the coupling layer induces antiferromagnetic or ferrimagnetic coupling between FL1 and FL2 depending on thickness, and DL1 and DL2 are dusting layers that enhance the coupling between FL1 and FL2. The SAF free layer may be used with a SAF reference layer in STT-MRAM memory elements or in spintronic devices including a spin transfer oscillator. Furthermore, a dual SAF structure is described that may provide further advantages in terms of Ho, PMA, and thermal stability.
申请公布号 US2014145792(A1) 申请公布日期 2014.05.29
申请号 US201213686169 申请日期 2012.11.27
申请人 HEADWAY TECHNOLOGIES, INC. 发明人 WANG YU-JEN;JAN GUENOLE;TONG RU-YING
分类号 H03B15/00;G11B5/66;G11B5/84 主分类号 H03B15/00
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