发明名称 Capacitor and Method of Forming a Capacitor
摘要 A method for manufacturing a semiconductor device and a semiconductor device are disclosed. The method comprises forming a trench in a substrate, partially filling the trench with a first semiconductive material, forming an interface along a surface of the first semiconductive material, and filling the trench with a second semiconductive material. The semiconductor device includes a first electrode arranged along sidewalls of a trench and a dielectric arranged over the first electrode. The semiconductor device further includes a second electrode at least partially filling the trench, wherein the second electrode comprises an interface within the second electrode.
申请公布号 US2014145305(A1) 申请公布日期 2014.05.29
申请号 US201414170085 申请日期 2014.01.31
申请人 INFINEON TECHNOLOGIES AG 发明人 LEHNERT WOLFGANG;STADTMUELLER MICHAEL;POMPL STEFAN;MEYER MARKUS
分类号 H01L49/02 主分类号 H01L49/02
代理机构 代理人
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