TEST SYSTEM FOR TESTING A CMOS IMAGE SENSOR AND A DRIVING METHOD THEREOF

摘要

A test system including a test device configured to transmit an input signal and a control signal to at least one complementary metal-oxide semiconductor (CMOS) image sensor via a probe card, and an interface board configured to map the probe card and the test device. The interface board includes an output receiver configured to receive an image signal from the at least one CMOS image sensor and transform the image signal into image data.