发明名称 ETCHING USING BLOCK COPOLYMER
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a good pattern using a self-assembled block copolymer material.SOLUTION: A method for forming a pattern includes: a step of obtaining a self-assembled block copolymer layer (21) on a neutral layer (22'') overlying a substrate (23), the self-assembled block copolymer layer including at least two polymer components having mutually different etching resistances, and furthermore having a copolymer pattern structure formed by micro-phase separation of the at least two polymer components; a step of selectively etching a first polymer component of the self-assembled block copolymer layer (21) so that a second polymer component (24) remains; and a step (16) of applying plasma etching to the neutral layer (22'') using the second polymer component (24) as a mask. The plasma etching is performed using inert gas and H.
申请公布号 JP2014099604(A) 申请公布日期 2014.05.29
申请号 JP20130223393 申请日期 2013.10.28
申请人 IMEC;TOKYO ELECTRON LTD 发明人 CHAN BOON TEIK;TAWARA SHIGERU
分类号 H01L21/3065 主分类号 H01L21/3065
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