发明名称 DEEP TRENCH STRUCTURE FOR HIGH DENSITY CAPACITOR
摘要 Some embodiments relate to high density capacitor structures. Some embodiments include a semiconductor substrate having an conductive region with a plurality of trenches formed therein. A first dielectric layer is formed over respective bottom portions and respective sidewall portions of the respective trenches. A first conductive layer is formed in the trench and over the first dielectric layer, wherein the first dielectric layer acts as a first capacitor dielectric between the conductive region and the first conductive layer. A second dielectric layer is formed in the trench and over the first conductive layer. A second conductive layer is formed in the trench and over the second dielectric layer, wherein the second dielectric layer acts as a second capacitor dielectric between the first conductive layer and the second conductive layer. Other embodiments are also disclosed.
申请公布号 US2014145299(A1) 申请公布日期 2014.05.29
申请号 US201213685029 申请日期 2012.11.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 KALNITSKY ALEX;TSUI FELIX YING-KIT;CHENG HSIN-LI;YANG JING-HWANG;LIN JYUN-YING
分类号 H01L49/02 主分类号 H01L49/02
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